The BLS Microscopy Facility @ LLG

Key laser systems

Taccor, Laser quantum GHz reprate system

Laser type: Ti:Sa Frequency comb
Parameter summary: Rep.rate 1 GHz, 30-500 fs, 816 nm, Up to 1 nJ
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Excelsior, Spectra Physics low noice narrow bandwidth laser

Laser type: DPSS
Parameter summary: cw,  Spectral Linewidth: <10 MHz, 532nm 200 mW

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Key experimental stations

(Frigg) FC-BLS

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  • Type of experiment:  Frequency comb enhanced Brillouin microscopy.
  • Description: Confocal microscopy with a diffraction-limited resolution of 200 nm. The scattered light from the sample surface is then analyzed by a high-contrast six-pass Tandem Fabry–Perot interferometer TFP-2 (JRS Scientific Instruments). fs-Laser comb focused, with a diffraction-limited spot of 800-1000nm, scanned using Galvo-mirrors, excites the sample, and GHz BLS signal is measured proportional to the square of the amplitude of the sample-plane dynamics (Phonons, magnons) at the corresponding frequency (300 MHz-2 THz).
  • Beam parameters: Probe: CW, Spectral Linewidth: <10 MHz, 532nm 200 mW. Pump: Taccor, Frequency comb fs-Laser, 1 GHz, 30-500 fs, 816 nm, Up to 1 nJ
  • Auxiliary equipment: Radio frequency components, Time tagger 30 ps.
  • Contact person: Ahmad Awad


(Freja) BLS

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  • Type of experiment: Inelastic Brillouin light scattering microscopy on solid and soft matter

  • Description: Confocal microscopy with diffraction-limited resolution of 360 nm. The scattered light from the sample surface is analyzed by a high-contrast six-pass Tandem Fabry–Perot interferometer TFP-1 (JRS Scientific Instruments). The BLS intensity proportional to the square of the amplitude of the sample plane dynamics(Phonons, magnons) at the corresponding frequency(300 MHz-2 THz).

  • Beam parameters: Spectral Linewidth: <10 MHz, 532nm 200 mW.

  • Auxiliary equipment: Radio frequency components, Spectrum analyzer 40 GHz, EOM 40 GHz, Time tagger 30 ps.

  • Contact person: Ahmad Awad

(Freja) FR-MoKe

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  • Type of experiment: High-frequency resolved Magnetooptical Kerr effect.
  • Description: Diffraction-limited resolution of 200- 360 nm. The scattered light from the sample surface is then analyzed by a high-frequency fiber-coupled PD up to 48GHz. The Scattered light intensity proportional to the amplitude of the sample-plane dynamics at the corresponding frequency is measured using VNA.
  • Beam parameters: CW,  Spectral Linewidth: <1 MHz, 532.3nm 200 mW.
  • Auxiliary equipment: Radio frequency components, VNA 40 GHz, Spectrum analyzer 40 GHz, EOM 40 GHz, Time tagger 30 ps.
  • Contact person: Ahmad Awad