Ultrafast laser spectroscopy lab @ LLS

The ultrafast laser spectroscopy facility maintains state-of-the-art capabilities of characterization of ultrafast response in solid state materials by employing time-resolved angle-resolved photoelectron spectroscopy, ultrafast electron microscopy, photoluminescence dynamics and time-resolved scanning near-field optical microscopy.

Key laser systems

Tangerine HP

Laser type: Yb-fiber MOPA
Parameter summary: Repetition rate 0 - 2 MHz, Wavelength 1030 nm, Pulse length 300 fs - 10 ps, Pulse energy 100 µJ @ 350 kHz, Average power 35 W


Fiber laser from Amplitude Systemes. Equipped with 2nd and 4th harmonic generation module.

Tangerine HP2

Laser type: Yb-fiber MOPA
Parameter summary: Repetition rate 0 - 2 MHz, Wavelength 1030 nm, Pulse length 300 fs - 10 ps, Pulse energy 200 µJ @ 250 kHz, Average power 50 W


Fiber laser from Amplitude Systemes. Equipped with 2nd and 3rd harmonic generation module. From mid 2018 also SPM and pulse compression down to 50 fs with 80% transmission.
FUEGO
Laser type: Nd:YVO4, MOPA
Parameter summary: Repetition rate 200 kHz-8 MHz, Wavelength 1064 nm, Pulse length 9 ps, Pulse energy 250 µJ @ 200 kHz, Average power 50 W


MOPA laser from Time-Bandwidth Products now Lumentum. Equipped with 2nd and 3rd harmonic generation stage.
MIRA/OPO
Laser type: Ti:Sapphire oscillator with optical parametric oscillator
Parameter summary: Spectral tuning range: 750 -900 and 1100-1300 nm, pulse duration 150-200 fs, average power 1 W@800 nm, 200 mW@1200 nm.


Ti:Sapphire mode-locked oscillator-optical parametric oscillator system delivering tunable femtosecond pulses in´the near-infrared.
Chameleon Ultra II
Laser type: Ti:Sapphire oscillator with pulse selector and harmonics generator
Parameter summary: Repetition rate 80 MHz, Tuning range 680 nm-1080 nm, Average power 2.5W @ 800 nm, Pulse length 200 fs. Harmonics generator: tuning range 210 nm -530 nm, power 200 mW @260 nm, 500 mW @ 400 nm.


Automated tunable Ti:Sapphire oscillator from Coherent. Used for excitation and probing lumninescence and as a pump source for near-field optical scanning microscopy.

Key experimental stations

High rep rate XUV Beamline for time-resolved-ARPES

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  • Type of experiment: Time- and Angle Resolved PhotoElectron Spectroscopy (tr-ARPES)
  • Description: High-order harmonic generation (HHG) in tight focusing geometry using continuous gas jet. Followed by grating monochromator in transverse geometry.
  • Beam parameters: 250 kHz - 1 MHz, 7 - 40 eV photon energy (currently 11-18 excluded), < 300 fs, ~10^3 photons/pulse @ 500 kHz
  • Auxiliary equipment: ARPES end station featuring, Time-of-Flight spectrometer THEMIS, cryo-cooled manipulator <10 K, preparation chamber with LEED and fast entry load-lock.
  • Contact person: Oscar Tjernberg

Ultrafast Electron Microscopy (UEM)

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  • Type of experiment: Time resolved electron microscopy, spectroscopy and diffraction
  • Description: Time-resolved transmission electron microscopy (pump probe). Total electron resolution < 1 ps, energy resolution < 2 eV, lateral resolution 1 nm in imaging and 1 Å in diffraction
  • Beam parameters: Rep. Rate: Single shot - 2 MHz
    Wavelength: 258, 515, and 1030 nm, Pulse duration: < 300 fs, Pulse energy: 100 µJ @ 350 kHz
  • Auxiliary equipment: Modified JEOL JEM 2100 transmission electron microscopy, Gatan Quantum SE imaging electron analyzer
  • Contact person: Jonas Weissenrieder

Time-resolved photoluminescence and pump-probe spectroscopy

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  • Type of experiment: Time-resolved photoluminescence with temporal resolution of 5ps, differential transmission and reflection measurements with temporal resolution of 200 fs.
  • Description: Time-resolved photoluminescence and differential transmission/reflection measurements integrated over the sample area of tens µm2.
  • Beam parameters: Spectral tuning ranges 210 nm -530 nm, 680 nm-1080 nm, 1100-1300 nm. Repetition rate 80 MHz. Pulse length 200 fs.
  • Auxiliary equipment: Hamamatsu synchroscan streak camera for time-resolved PL measurements, Montana Instruments Cryostation (3-350 K) for sample cooling, spectrometers, time-correlated single photon counting system.
  • Contact person: Saulius Marcinkevicius

Time- and spatially resolved near-field photoluminescence microscopy

  • Type of experiment: Time- and spatially resolved near-field photoluminescence and surface morphology measurements.
  • Description: Mapping of PL properties (spectra, dynamics) as well as surface morphology over a certain area with 100 nm spatial and 50 ps temporal resolution.
  • Beam parameters: Spectral tuning ranges 210 nm -530 nm, 680 nm-1080 nm, 1100-1300 nm. Repetition rate 80 MHz. Pulse length 200 fs.
  • Auxiliary equipment: Nanonics scanning near-field optical microscope MultiView 4000 time-correlated single photon counting system.
  • Contact person: Saulius Marcinkevicius